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AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory

    Buy cheap AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory from wholesalers
     
    Buy cheap AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory from wholesalers
    • Buy cheap AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory from wholesalers

    AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory

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    Brand Name : Anterwell
    Model Number : AM29F010B-90JC
    Certification : new & original
    Price : Negotiate
    Payment Terms : T/T, Western Union, Paypal
    Supply Ability : 8100pcs
    Delivery Time : 1 day
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    AM29F010B-90JC Electronic IC Chips Uniform Sector Flash Memory


    Am29F010B

    1 Megabit (128 K x 8-bit) CMOS 5.0 Volt-only, Uniform Sector Flash Memory


    DISTINCTIVE CHARACTERISTICS

    ■ Single power supply operation

    — 5.0 V ± 10% for read, erase, and program operations

    — Simplifies system-level power requirements

    ■ Manufactured on 0.32 µm process technology

    — Compatible with Am29F010 and Am29F010A device

    ■ High performance

    — 45 ns maximum access time


    ■ Low power consumption

    — 12 mA typical active read current

    — 30 mA typical program/erase current

    — <1 µA typical standby current

    ■ Flexible sector architecture

    — Eight 16 Kbyte sectors

    — Any combination of sectors can be erased

    — Supports full chip erase


    ■ Sector protection

    — Hardware-based feature that disables/reenables program and erase operations

    in any combination of sectors

    — Sector protection/unprotection can be implemented using standard PROM programming equipment

    ■ Embedded Algorithms

    — Embedded Erase algorithm automatically pre-programs and erases the chip or

    any combination of designated sector

    — Embedded Program algorithm automatically programs and verifies data at specified address


    ■ Erase Suspend/Resume

    — Supports reading data from a sector not being erased

    ■ Minimum 1 million erase cycles guaranteed per sector

    ■ 20-year data retention at 125°C

    — Reliable operation for the life of the system


    ■ Package options

    — 32-pin PLCC

    — 32-pin TSOP

    — 32-pin PDIP

    ■ Compatible with JEDEC standards

    — Pinout and software compatible with single-power-supply flash

    — Superior inadvertent write protection

    ■ Data# Polling and Toggle Bits

    — Provides a software method of detecting program or erase cycle completion


    BLOCK DIAGRAM


    ABSOLUTE MAXIMUM RATINGS

    Storage Temperature Plastic Packages . . . . . . . . . . . . . . . –65°C to +125°C

    Ambient Temperature with Power Applied. . . . . . . . . . . . . . –55°C to +125°C

    Voltage with Respect to Ground

    VCC (Note 1). . . . . . . . . . . . . . . . . . . .–2.0 V to +7.0 V

    A9 (Note 2). . . . . . . . . . . . . . . . . . . .–2.0 V to +13.0 V

    All other pins (Note 1) . . . . . . . . . . . .–2.0 V to +7.0 V

    Output Short Circuit Current (Note 3) . . . . . . . 200 mA


    Notes:

    1. Minimum DC voltage on input or I/O pin is –0.5 V. During voltage transitions, inputs may overshoot VSS to –2.0 V for periods of up to 20 ns. See Figure 5. Maximum DC voltage on input and I/O pins is VCC + 0.5 V. During voltage transitions, input and I/O pins may overshoot to VCC + 2.0 V for periods up to 20 ns. See Figure 6.

    2. Minimum DC input voltage on A9 pin is –0.5V. During voltage transitions, A9 pins may overshoot VSS to –2.0 V for periods of up to 20 ns. See Figure 5. Maximum DC input voltage on A9 is +12.5 V which may overshoot to 14.0 V for periods up to 20 ns.

    3. No more than one output shorted at a time. Duration of the short circuit should not be greater than one second.

    Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.


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